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DOD - SMD 5962-84079

MICROCIRCUIT, DIGITAL, ADVANCED LOW POWER SCHOTTKY TTL, DECADE COUNTER, MONOLITHIC SILICON

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Organization: DOD
Publication Date: 20 October 2015
Status: inactive
Page Count: 11
scope:

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Document History

SMD 5962-84079
August 3, 2020
MICROCIRCUIT, DIGITAL, ADVANCED LOW POWER SCHOTTKY TTL, DECADE COUNTER, MONOLITHIC SILICON
Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.
SMD 5962-84079
October 20, 2015
MICROCIRCUIT, DIGITAL, ADVANCED LOW POWER SCHOTTKY TTL, DECADE COUNTER, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
SMD-5962-84079 REV F
November 17, 2005
MICROCIRCUIT, DIGITAL, ADVANCED LOW POWER SCHOTTKY TTL, DECADE COUNTER, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
SMD-5962-84079 REV E
September 20, 1999
MICROCIRCUIT, DIGITAL, ADVANCED LOW POWER SCHOTTKY TTL, DECADE COUNTER, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
SMD-5962-84079 REV D
October 5, 1992
MICROCIRCUIT, DIGITAL, ADVANCED LOW POWER SCHOTTKY TTL, DECADE COUNTER, MONOLITHIC SILICON
This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices"....
SMD-5962-84079 REV C
February 20, 1992
MICROCIRCUIT, DIGITAL, ADVANCED LOW POWER SCHOTTKY TTL, DECADE COUNTER, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-84079 REV B
May 29, 1987
MICROCIRCUIT, DIGITAL, ADVANCED LOW POWER SCHOTTKY TTL, DECADE COUNTER, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-84079 REV A
September 2, 1986
MICROCIRCUIT, DIGITAL, ADVANCED LOW POWER SCHOTTKY TTL, DECADE COUNTER, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-84079
July 31, 1984
MICROCIRCUIT, DIGITAL, ADVANCED LOW POWER SCHOTTKY TTL, DECADE COUNTER, MONOLITHIC SILICON
A description is not available for this item.
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References

This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-HDBK-103 - LIST OF STANDARD MICROCIRCUIT DRAWINGS
Published by NPFC on March 8, 2021
Purpose. The Standard Microcircuit Drawing Program (SMDP) is directly under the auspices of the DoD Parts Management Program (PMP). The PMP is implemented by MIL-HDBK-512, "Parts Management." The PMP...
This document references:
MIL-HDBK-780D VALID NOTICE 1 - Standard Microcircuit Drawings
Published by DLA on December 28, 2021
A description is not available for this item.
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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