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SMD 5962-89506 - MICROCIRCUIT, DIGITAL, FAST CMOS, BUS DRIVER, MONOLITHIC SILICON
November 28, 2016 - NPFC

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

SMD 5962-93111 - MICROCIRCUIT, DIGITAL, ECL, QUAD BUS DRIVER, MONOLITHIC SILICON
May 2, 2016 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

SMD 5962-84067 - MICROCIRCUIT, DIGITAL, CMOS, OCTAL LATCHING BUS DRIVER, MONOLITHIC SILICON
July 11, 2011 - DOD

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

SMD 5962-86879 - MICROCIRCUIT, LINEAR, BUS INTERFACE DRIVER CIRCUIT, MONOLITHIC SILICON
October 9, 2014 - DOD

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

SMD 5962-89663 - MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY TTL, 9 BIT PARITY GENERATORS/CHECKER WITH BUS DRIVER PARITY I/O PORT, MONOLITHIC SILICON
February 4, 2010 - DOD

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

SMD 5962-92018 - MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 16-BIT BUS DRIVERS WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
August 29, 2013 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

SMD 5962-06201 - MICROCIRCUIT, LINEAR, LINE DRIVER, QUAD DIFFERENTIAL, BUS LVDS, MONOLITHIC SILICON
August 18, 2017 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

SMD 5962-90744 - MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, 10-BIT BUS/MOS MEMORY DRIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
February 14, 2013 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

SMD 5962-90745 - MICROCIRCUITS, DIGITAL, BIPOLAR CMOS, 10-BIT BUS/MOS MEMORY DRIVERS, TTL COMPATIBLE, MONOLITHIC SILICON
June 16, 2015 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

SMD 5962-97624 - MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 16-BIT BUFFER/DRIVER WITH BUS HOLD AND THREESTATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
April 28, 2016 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

DS/ISO 17987-7 - Road vehicles – Local Interconnect Network (LIN) – Part 7: Electrical Physical Layer (EPL) conformance test specification
December 19, 2016 - DS

ISO 17987-7:2016 specifies the conformance test for the electrical physical layer (EPL) of the LIN communications system. It is part of this document to define a test that considers ISO 9646 and ISO 17987‑4. The purpose of ISO 17987-7:2016 is to provide a standardized way to verify whether a LIN...

ISO 17987-7 - Road vehicles - Local Interconnect Network (LIN) - Part 7: Electrical Physical Layer (EPL) conformance test specification
December 1, 2016 - ISO

This document specifies the conformance test for the electrical physical layer (EPL) of the LIN communications system. It is part of this document to define a test that considers ISO 9646 and ISO 17987-4. The purpose of this document is to provide a standardized way to verify whether a LIN...

SAE J1517 - Driver Selected Seat Position for Class B Vehicles - Seat Track Length and SgRP
October 1, 2011 - SAE

This Recommended Practice provides a procedure to locate driver seat tracks, establish seat track length, and define the SgRP in Class B vehicles (heavy trucks and buses). Three sets of equations that describe where drivers position horizontally adjustable seats are available...

ISO 17458-5 - Road vehicles- FlexRay communications system - Part 5: Electrical physical layer conformance test specification
February 1, 2013 - ISO

This part of ISO 17458 specifies the conformance test for the electrical physical layer of the FlexRay communications system. This part of ISO 17458 defines a test that considers ISO 9646 and ISO 17458-4. The purpose of this part of ISO 17458 is to provide a standardized way to verify whether...

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