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SMD 5962-89506 - MICROCIRCUIT, DIGITAL, FAST CMOS, BUS DRIVER, MONOLITHIC SILICON
November 28, 2016 - NPFC

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

SMD 5962-93111 - MICROCIRCUIT, DIGITAL, ECL, QUAD BUS DRIVER, MONOLITHIC SILICON
May 2, 2016 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

SMD 5962-84067 - MICROCIRCUIT, DIGITAL, CMOS, OCTAL LATCHING BUS DRIVER, MONOLITHIC SILICON
July 11, 2011 - DOD

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

SMD 5962-86879 - MICROCIRCUIT, LINEAR, BUS INTERFACE DRIVER CIRCUIT, MONOLITHIC SILICON
May 12, 2020 - DOD

Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

SMD 5962-92022 - MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 16- BIT BUS DRIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
February 22, 2019 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

SMD 5962-89663 - MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY TTL, 9 BIT PARITY GENERATORS/CHECKER WITH BUS DRIVER PARITY I/O PORT, MONOLITHIC SILICON
February 4, 2010 - DOD

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

SMD 5962-92018 - MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 16-BIT BUS DRIVERS WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
August 29, 2013 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

SMD 5962-06201 - MICROCIRCUIT, LINEAR, LINE DRIVER, QUAD DIFFERENTIAL, BUS LVDS, MONOLITHIC SILICON
August 18, 2017 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

SMD 5962-90744 - MICROCIRCUIT, DIGITAL, BIPOLAR CMOS, 10-BIT BUS/MOS MEMORY DRIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
June 24, 2020 - DOD

Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a...

SMD 5962-90745 - MICROCIRCUITS, DIGITAL, BIPOLAR CMOS, 10-BIT BUS/MOS MEMORY DRIVERS, TTL COMPATIBLE, MONOLITHIC SILICON
June 16, 2015 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

SMD 5962-97624 - MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 16-BIT BUFFER/DRIVER WITH BUS HOLD AND THREESTATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
April 28, 2016 - DOD

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of...

DS/ISO 17987-7 - Road vehicles – Local Interconnect Network (LIN) – Part 7: Electrical Physical Layer (EPL) conformance test specification
December 19, 2016 - DS

ISO 17987-7:2016 specifies the conformance test for the electrical physical layer (EPL) of the LIN communications system. It is part of this document to define a test that considers ISO 9646 and ISO 17987‑4. The purpose of ISO 17987-7:2016 is to provide a standardized way to verify whether a LIN...

ISO 17987-7 - Road vehicles - Local Interconnect Network (LIN) - Part 7: Electrical Physical Layer (EPL) conformance test specification
December 1, 2016 - ISO

This document specifies the conformance test for the electrical physical layer (EPL) of the LIN communications system. It is part of this document to define a test that considers ISO 9646 and ISO 17987-4. The purpose of this document is to provide a standardized way to verify whether a LIN...

ISO 17458-5 - Road vehicles- FlexRay communications system - Part 5: Electrical physical layer conformance test specification
February 1, 2013 - ISO

This part of ISO 17458 specifies the conformance test for the electrical physical layer of the FlexRay communications system. This part of ISO 17458 defines a test that considers ISO 9646 and ISO 17458-4. The purpose of this part of ISO 17458 is to provide a standardized way to verify whether...

DSF/ISO/FDIS 17987-7 - Road vehicles -- Local Interconnect Network (LIN) -- Part 7: Electrical Physical Layer (EPL) conformance test specification
DS

This part of ISO 17987 specifies the conformance test for the electrical physical layer of the LIN communications system. It is part of this document to define a test that considers ISO 9646 and ISO 17987-4. The purpose of this document is to provide a standardized way to verify whether a LIN...

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