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DS/EN ISO 9220 - METALLIC COATINGS - MEASUREMENT OF COATING THICKNESS - SCANNING ELECTRON MICROSCOPE METHOD Organization: DS
Date: 1994-12-20
Description: This standard specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-sections with a scanning electron microscope.
TSE - TS EN ISO 9220 - METALLIC COATINGS-MEASUREMENT OF COATING THICKNESS-SCANNING ELECTRON MICROSCOPE METHOD Organization: TSE
Date: 2001-02-06
Description: This standard, specifies a method for the measurement of thelocal thickness of metallic coating by examination of cross-section with a scanning electron microscope (SEM) Bu standard, tarayici elektron mikroskobu (TEM) kullanilarakmetalik kaplamanin yerel kalinliginin olcumu icin bir metodukapsar.
CRC - NE10603 - LINEAR AND CHIRAL DICHROISM IN THE ELECTRON MICROSCOPE Organization: CRC
Date: 2012-03-01
Description: EMCD is the equivalent of XMCD but is based on fast probe electrons in the electron microscope. A spatial resolution of 2 nm has been demonstrated, and the lattice-resolved mapping of atomic spins appears feasible.
ASTM E986 - STANDARD PRACTICE FOR SCANNING ELECTRON MICROSCOPE BEAM SIZE CHARACTERIZATION Organization: ASTM
Date: 2004-07-01
Description: This practice provides a reproducible means by which one aspect of the performance of a scanning electron microscope (SEM) may be characterized. The resolution of an SEM depends on many factors, some of which are electron beam voltage and current, lens aberrations, contrast in the specimen, and operator-instrument-material interaction.
ISO 25498 - MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - SELECTED-AREA ELECTRON DIFFRACTION ANALYSIS USING A TRANSMISSION ELECTRON MICROSCOPE - FIRST EDITION Organization: ISO
Date: 2010-06-01
Description: This International Standard specifies the method of selected-area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to analyse micrometer and sub-micrometer sized areas of thin crystalline specimens.
ISO FDIS 25498 - MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - SELECTED-AREA ELECTRON DIFFRACTION ANALYSIS USING A TRANSMISSION ELECTRON MICROSCOPE Organization: ISO
Date: 2017-11-08
Description: This document specifies the method of selected area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to analyse thin crystalline specimens.
ASTM E766 - STANDARD PRACTICE FOR CALIBRATING THE MAGNIFICATION OF A SCANNING ELECTRON MICROSCOPE Organization: ASTM
Date: 2014-01-01
Description: This practice covers general procedures necessary for the calibration of magnification of scanning electron microscopes. The relationship between true magnification and indicated magnification is a complicated function of operating conditions.2 Therefore, this practice must be applied to each set of standard operating conditions to be used.
ASTM E2142 - STANDARD TEST METHODS FOR RATING AND CLASSIFYING INCLUSIONS IN STEEL USING THE SCANNING ELECTRON MICROSCOPE Organization: ASTM
Date: 2008-10-01
Description: This test method covers procedures to obtain particle size distribution, chemical classification, and Test Methods E45 ratings of inclusions in steels using an automated scanning electron microscope (SEM) with X-ray analysis and automatic image analysis capabilities.
NPFC - DI-QCIC-80864 - SCANNING ELECTRON MICROSCOPE ANALYSIS REPORT Organization: NPFC
Date: 1989-06-22
GOST 21006 - "ELECTRON MICROSCOPES. TERMS, DEFINITIONS AND LETTER SYMBOLS" Organization: GOST
Date: 1975-01-01
NASA - GSFC S-311-P-12 - SCANNING ELECTRON MICROSCOPE INSPECTION OF SEMICON Organization: NASA
GOST - 21006 - ELECTRON MICROSCOPES. TERMS DEFINITIONS AND LETTER SYMBOLS Organization: GOST
Date: 1975-01-01
AFNOR - NF EN ISO 9220 - METALLIC COATINGS. MEASUREMENT OF COATING THICKNESS. SCANNING ELECTRON MICROSCOPE METHOD. Organization: AFNOR
Date: 1995-04-01
SAC - GB 7667-96 - THE DOSE OF X-RAYS LEAKAGE FROM ELECTRON MICROSCOPE Organization: SAC
Date: 1996-08-13
BSI - BS EN ISO 9220 - METALLIC COATINGS - MEASUREMENT OF COATING THICKNESS - SCANNING ELECTRON MICROSCOPE METHOD - AMD 8499: APRIL 1995 Organization: BSI
Date: 1989-09-29
CEN - EN ISO 9220 - METALLIC COATINGS - MEASUREMENT OF COATING THICKNESS - SCANNING ELECTRON MICROSCOPE METHOD Organization: CEN
Date: 1994-01-01
GSFC-S-311-39 - TRANSISTOR, MICROWAVE, SCANNING ELECTRON MICROSCOPE (SEM) INSPECTION PROCEDURE Organization: GSFC
Date: 1974-09-30
BSI - BS ISO 25498 - MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - SELECTED-AREA ELECTRON DIFFRACTION ANALYSIS USING A TRANSMISSION ELECTRON MICROSCOPE Organization: BSI
Date: 2010-06-30
ISO DIS 25498 - MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - SELECTED-AREA ELECTRON DIFFRACTION ANALYSIS USING A TRANSMISSION ELECTRON MICROSCOPE Organization: ISO
SN - NS-EN ISO 9220:1994 - METALLIC COATINGS - MEASUREMENT OF COATING THICKNESS - SCANNING ELECTRON MICROSCOPE METHOD (ISO 9220:1988) Organization: SN
Date: 1995-03-07

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