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DS/EN ISO 9220 - Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
December 20, 1994 - DS

This standard specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-sections with a scanning electron microscope.

DI-QCIC-80864 - SCANNING ELECTRON MICROSCOPE ANALYSIS REPORT
June 22, 1989 - NPFC
A description is not available for this item.
ASTM E986 - Standard Practice for Scanning Electron Microscope Beam Size Characterization
July 1, 2004 - ASTM

This practice provides a reproducible means by which one aspect of the performance of a scanning electron microscope (SEM) may be characterized. The resolution of an SEM depends on many factors, some of which are electron beam voltage and current, lens aberrations, contrast in...

GSFC S-311-P-12 - SCANNING ELECTRON MICROSCOPE INSPECTION OF SEMICON
NASA
A description is not available for this item.
ISO 25498 - Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
March 1, 2018 - ISO

This document specifies the method of selected area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to analyse thin crystalline specimens. This document applies to test areas of micrometres and sub-micrometres in size. The minimum diameter of...

ASTM E766 - Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
January 1, 2014 - ASTM

This practice covers general procedures necessary for the calibration of magnification of scanning electron microscopes. The relationship between true magnification and indicated magnification is a complicated function of operating conditions.2 Therefore, this practice must be applied...

BS EN ISO 9220 - Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
September 29, 1989 - BSI
A description is not available for this item.
ASTM E2142 - Standard Test Methods for Rating and Classifying Inclusions in Steel Using the Scanning Electron Microscope
October 1, 2008 - ASTM

This test method covers procedures to obtain particle size distribution, chemical classification, and Test Methods E45 ratings of inclusions in steels using an automated scanning electron microscope (SEM) with X-ray analysis and automatic image analysis capabilities. There are three...

GOST 21006 - "Electron microscopes. Terms, definitions and letter symbols"
January 1, 1975 - GOST
A description is not available for this item.
ASTM B748 - Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
February 23, 1990 - ASTM

This test method covers the measurement of metallic coating thicknesses by examination of a cross section with a scanning electron microsope (SEM). The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. This standard does...

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