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Electron Microscopy and Analysis
July 7, 2017 - CRC

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was...

Electron Microscopy and Analysis 2001
December 1, 2001 - CRC

Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and...

ISO 22493 - Microbeam analysis - Scanning electron microscopy - Vocabulary
April 15, 2014 - ISO

This International Standard defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also...

Electron Microscopy and Analysis 2003: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, 3-5 September 2003
February 19, 2004 - CRC

Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current...

Image Formation in Low-Voltage Scanning Electron Microscopy
January 1, 1993 - SPIE

While most textbooks about scanning electron microscopy (SEM) cover the high-voltage range from 5-50 keV, this volume considers the special problems in low-voltage SEM and summarizes the differences between LVSEM and conventional SEM. Chapters cover the influence of lens aberrations...

ISO 19214 - Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
April 1, 2017 - ISO

This document prescribes a method for the determination of apparent growth direction by transmission electron microscopy. It is applicable to all kinds of wirelike crystalline materials fabricated by various methods. This document can also guide in ascertaining an axis direction of...

Introduction to Scanning Transmission Electron Microscopy
June 28, 2018 - CRC

STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique. Authors: Dr Robert Keyse, Anthony J....

BS ISO 22493 - Microbeam analysis - Scanning electron microscopy - Vocabulary
April 30, 2014 - BSI
A description is not available for this item.
BS ISO 15932 - Microbeam analysis — Analytical electron microscopy — Vocabulary
December 31, 2013 - BSI
A description is not available for this item.
ISO 15932 - Microbeam analysis - Analytical electron microscopy - Vocabulary
December 15, 2013 - ISO
A description is not available for this item.
KS M 0044 - General rules for scanning electron microscopy
January 1, 1999 - KSA
A description is not available for this item.
JIS K 0132 - General Rules for Scanning Electron Microscopy
September 20, 1997 - JSA
A description is not available for this item.
LOW VOLTAGE ELECTRON MICROSCOPY: PRINCIPLES AND APPLICATIONS
WILEY
A description is not available for this item.
ISO DIS 22493 - MICROBEAM ANALYSIS - SCANNING ELECTRON MICROSCOPY - VOCABULARY
ISO
A description is not available for this item.
DS/ISO/TS 10797 - Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
July 18, 2012 - DS

This Technical Specification establishes methods for characterizing the morphology of single-wall carbon nanotubes (SWCNTs) and identifying the elemental composition of other materials in SWCNT samples, using transmission electron microscopy and chemical analysis by energy dispersive...

ISO TS 10797 - Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
June 1, 2012 - ISO

This Technical Specification establishes methods for characterizing the morphology of single-wall carbon nanotubes (SWCNTs) and identifying the elemental composition of other materials in SWCNT samples, using transmission electron microscopy and chemical analysis by energy dispersive...

ISO DIS 20171 - Microbeam analysis - Scanning electron microscopy - Tagged image file format for Scanning electron microscopy(TIFF/SEM)
May 30, 2018 - ISO

This International Standard specifies the data file format of digital images generated by a scanning electron microscope (SEM) by adapting the TIFF based format. The data file includes not only the image data but the SEM conditional information defined in this format. This standard does not...

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