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5.1 Silicon (Si), a metalloid, is the second most abundant element in the earth's crust. Various forms of silica (silicon dioxide SiO2) are found in quartz, sand, and rocks. The degradation of these rocks results in silica found in natural waters. Silica in natural waters can be found as ionic...
1.1 This guide provides recommendations for water quality related to electronics and semiconductor-industry manufacturing. Seven classifications of water are described, including water for line widths as low as 0.032 μm. In all cases, the recommendations are for water at the point of...
5.1 Gamma-ray spectrometry of soil samples is used to identify and quantify certain gamma-ray emitting radionuclides. Use of a germanium semiconductor detector is necessary for high-resolution gamma-ray measurements. 5.2 Much of the data acquisition and analysis can be automated with the use...
This part of IEC 60204 applies to electrical, electronic and programmable electronic equipment and systems to machines not portable by hand while working, including a group of machines working together in a co-ordinated manner. NOTE 1 This part of IEC 60204 is an application standard and is not...
This part of IEC 60204 applies to electrical, electronic and programmable electronic equipment and systems to machines not portable by hand while working, including a group of machines working together in a co-ordinated manner. NOTE 1 This part of IEC 60204 is an application standard and is not...
This International Standard is applicable to transportable, mobile or installed assemblies intended to measure environmental air kerma rates or air absorbed dose rates from 30 nGy⋅h-1 to 30 μGy⋅h-1 or ambient dose equivalent rates from 30 nSv⋅h-1 to 30 μSv⋅h-1, or air kerma or air absorbed dose...
5.1 This test method is useful for detecting and determining organic and inorganic carbon impurities in water from a variety of sources including industrial water, drinking water, and waste water. 5.2 Measurement of these impurities is of vital importance to the operation of various industries such...
5.1 Silicon (Si), a metalloid, is the second most abundant element in the earth's crust. Various forms of silica (silicon dioxide SiO2) are found in quartz, sand, and rocks. The degradation of these rocks results in silica found in natural waters. Silica in natural waters can be found as ionic...
This guide provides recommendations for water quality related to electronics and semiconductor-industry manufacturing. Seven classifications of water are described, including water for line widths as low as 0.032 μm. In all cases, the recommendations are for water at the point of...
1.1 This guide provides recommendations for water quality related to electronics and semiconductor-industry manufacturing. Seven classifications of water are described, including water for line widths as low as 0.032 micron. In all cases, the recommendations are for water at the point of...
1.1 This guide provides recommendations for water quality related to electronics and semiconductor-industry manufacturing. Seven classifications of water are described, including water for line widths as low as 0.032 micron. In all cases, the recommendations are for water at the point of...
This Standard applies to electrical and electronic equipment (see definition 3.20) associated with semiconductor fabrication equipment (see definition 3.28) for the manufacture, measurement, assembly, and test of semiconductors. NOTE 1 In this Standard, the term electrical includes...
IEC 60204-33:2009 applies to electrical and electronic equipment associated with semiconductor fabrication equipment for the manufacture, measurement, assembly, and test of semiconductors. It is applicable to the electrical equipment or parts of the electrical equipment that operate...
This part of IEC 60204 applies to electrical and electronic equipment associated with semiconductor fabrication equipment for the manufacture, measurement, assembly, and test of semiconductors. NOTE 1 In this standard, the term electrical includes electrical, electronic, and...
Scope and object This International Standard is applicable to portable and transportable contamination meters and monitors designed for the direct measurement or the direct detection of surface contamination by photon radiation emitting radionuclides and which comprise at least: - a detection...
This part of IEC 60204 applies to electrical and electronic equipment associated with semiconductor fabrication equipment for the manufacture, measurement, assembly, and test of semiconductors. NOTE 1 In this standard, the term electrical includes electrical, electronic, and...
