JEDEC JEP 174
Understanding Electrical Overstress - EOS
active, Most Current
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| Organization: | JEDEC |
| Publication Date: | 1 September 2016 |
| Status: | active |
| Page Count: | 174 |
scope:
The scope of this white paper is damage to integrated circuits and systems caused by electrical stress, the terms and definitions associated with electrical stress to these integrated circuits and systems and the mitigation of this electrical stress event as it applies to integrated circuits and systems.
Document History
JEDEC JEP 174
September 1, 2016
Understanding Electrical Overstress - EOS
The scope of this white paper is damage to integrated circuits and systems caused by electrical stress, the terms and definitions associated with electrical stress to these integrated circuits and...