DOD - SMD 5962-92154
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 64K X 1 STATIC RANDOM ACCESS MEMORY, (SRAM), MONOLITHIC SILICON
active, Most Current
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| Organization: | DOD |
| Publication Date: | 12 April 2017 |
| Status: | active |
| Page Count: | 25 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PINin
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
SMD 5962-92154
April 12, 2017
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 64K X 1 STATIC RANDOM ACCESS MEMORY, (SRAM), MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
June 8, 2009
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 64K X 1 STATIC RANDOM ACCESS MEMORY, (SRAM), MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
July 5, 2001
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 64K X 1 STATIC RANDOM ACCESS MEMORY (SRAM), MONOLITHIC SILICON
A description is not available for this item.
September 15, 1993
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 64K X 1 STATIC RANDOM ACCESS MEMORY (SRAM), MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and...