UNLIMITED FREE ACCESS TO THE WORLD'S BEST IDEAS

close
Already an Engineering360 user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your Engineering360 Experience

close
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

DOD - SMD 5962-38128

MICROCIRCUIT, LINEAR, RADIATION HARDENED, PROGRAMMABLE VOLTAGE REFERENCE, MONOLITHIC SILICON

active, Most Current
Buy Now
Organization: DOD
Publication Date: 13 December 2017
Status: active
Page Count: 13
scope:

This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Document History

SMD 5962-38128
December 13, 2017
MICROCIRCUIT, LINEAR, RADIATION HARDENED, PROGRAMMABLE VOLTAGE REFERENCE, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are...
November 29, 2011
MICROCIRCUIT, LINEAR, RADIATION HARDENED, PROGRAMMABLE VOLTAGE REFERENCE, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
January 18, 2005
MICROCIRCUIT, LINEAR, RADIATION HARDENED, PROGRAMMABLE VOLTAGE REFERENCE, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
September 6, 2002
MICROCIRCUIT, LINEAR, RADIATION HARDENED, PROGRAMMABLE VOLTAGE REFERENCE, MONOLITHIC SILICON
A description is not available for this item.
June 17, 1998
MICROCIRCUIT, LINEAR, RADIATION HARDENED, PROGRAMMABLE VOLTAGE REFERENCE, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device Q and M) and space application (device class V). A choice of case outlines and lead finishes are...
November 27, 1996
MICROCIRCUIT, LINEAR, RADIATION HARDENED, PROGRAMMABLE VOLTAGE REFERENCE, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
October 20, 1993
MICROCIRCUIT, LINEAR, RADIATION HARDENED, PROGRAMMABLE VOLTAGE REFERENCE, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...
June 17, 1992
MICROCIRCUIT, LINEAR, RADIATION HARDENED, PROGRAMMABLE VOLTAGE REFERENCE, MONOLITHIC SILICON
A description is not available for this item.

References

Advertisement