IEC 60749-13
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
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| Organization: | IEC |
| Publication Date: | 1 February 2018 |
| Status: | active |
| Page Count: | 32 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.
The salt atmosphere test is considered destructive.
Document History
IEC 60749-13
February 1, 2018
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast...
August 1, 2003
Semiconductor Devices - Mechanical and Climatic Test Methods - Part 13: Salt Atmosphere CORRIGENDUM 1
A description is not available for this item.
April 1, 2002
Semiconductor Devices - Mechanical and Climatic Test Methods - Part 13: Salt Atmosphere
A description is not available for this item.