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JEDEC JESD 91

Method for Developing Acceleration Models for Electronic Component Failure Mechanisms

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Organization: JEDEC
Publication Date: 1 August 2003
Status: active
Page Count: 20
scope:

The method described in this document applies to all reliability mechanisms associated with electronic components.

The purpose of this standard is to provide a reference for developing acceleration models for defect-related and wear-out mechanisms in electronic components.

Document History

JEDEC JESD 91
August 1, 2003
Method for Developing Acceleration Models for Electronic Component Failure Mechanisms
The method described in this document applies to all reliability mechanisms associated with electronic components. The purpose of this standard is to provide a reference for developing acceleration...
August 1, 2003
Method for Developing Acceleration Models for Electronic Component Failure Mechanisms
The method described in this document applies to all reliability mechanisms associated with electronic components.The purpose of this standard is to provide a reference for developing acceleration...
December 1, 2001
Method for Developing Acceleration Models for Electronic Component Failure Mechanisms
A description is not available for this item.

References

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