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BSI - BS EN IEC 61967-1

Integrated circuits - Measurement of electromagnetic emissions Part 1: General conditions and definitions

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Organization: BSI
Publication Date: 28 February 2019
Status: active
Page Count: 32
ICS Code (Integrated circuits. Microelectronics): 31.200

Document History

BS EN IEC 61967-1
February 28, 2019
Integrated circuits - Measurement of electromagnetic emissions Part 1: General conditions and definitions
A description is not available for this item.
BS EN 61967-1
July 2, 2002
Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHZ to 1 GHz - Part 1: General Conditions and Definitions
A description is not available for this item.

References

This document references:
EN 62132-1 - Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
Published by CENELEC on February 1, 2016
This part of IEC 62132 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines...
This document references:
IEC 60050-161 - Amendment 2 International Electrotechnical Vocabulary Chapter 161: Electromagnetic Compatibility
Published by IEC on April 1, 1998
A description is not available for this item.
This document references:
IEC 61967-2 - Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions TEM cell and wideband TEM cell method
Published by IEC on September 1, 2005
This test procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is...
This document references:
IEC 61967-5 - Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 5: Measurement of conducted emissions Workbench Faraday Cage method
Published by IEC on February 1, 2003
This part of IEC 61967 describes a method to measure the conducted electromagnetic emission of integrated circuits either applied on the standardised test-board or on a final printed circuit board...
This document references:
IEC 61967-6 - Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method
Published by IEC on June 1, 2008
This part of the IEC 61967 specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This...
This document is referenced by:
BS EN 61967-6 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
Published by BSI on October 24, 2002
A description is not available for this item.
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