DOD - SMD 5962-10204
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4MEG X 32-BIT (128M), RADIATION-HARDENED, DUAL VOLTAGE SRAM with embedded EDAC, MULTICHIP MODULE
active, Most Current
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| Organization: | DOD |
| Publication Date: | 21 April 2020 |
| Status: | active |
| Page Count: | 33 |
scope:
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
SMD 5962-10204
April 21, 2020
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4MEG X 32-BIT (128M), RADIATION-HARDENED, DUAL VOLTAGE SRAM with embedded EDAC, MULTICHIP MODULE
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
November 5, 2014
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4MEG X 32-BIT (128M), RADIATION-HARDENED, DUAL VOLTAGE SRAM with embedded EDAC, MULTICHIP MODULE
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
January 11, 2013
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4MEG X 32-BIT (128M), RADIATION-HARDENED, DUAL VOLTAGE SRAM with embedded EDAC, MULTICHIP MODULE
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...