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DLA - DSCC-VID-V62/03638 REV D

MICROCIRCUIT, LINEAR, DIFFERENTIAL COMPARATOR WITH STROBES, MONOLITHIC SILICON

active, Most Current
Organization: DLA
Publication Date: 26 May 2020
Status: active
Page Count: 10
scope:

Scope.

This drawing documents the general requirements of a high performance differential comparator with strobes microcircuit, with an operating temperature range of -40°C to +125°C for device 01, and an operating temperature range of -55°C to +125°C for device 02.

Document History

DSCC-VID-V62/03638 REV D
May 26, 2020
MICROCIRCUIT, LINEAR, DIFFERENTIAL COMPARATOR WITH STROBES, MONOLITHIC SILICON
Scope. This drawing documents the general requirements of a high performance differential comparator with strobes microcircuit, with an operating temperature range of -40°C to +125°C for device 01,...
DSCC-VID-V62/03638 REV C
December 22, 2014
MICROCIRCUIT, LINEAR, DIFFERENTIAL COMPARATOR WITH STROBES, MONOLITHIC SILICON
This drawing documents the general requirements of a high performance differential comparator with strobes microcircuit, with an operating temperature range of -40°C to +125°C for device 01, and an...
DSCC-VID-V62/03638 REV B
November 10, 2008
MICROCIRCUIT, LINEAR, DIFFERENTIAL COMPARATOR WITH STROBES, MONOLITHIC SILICON
This drawing documents the general requirements of a high performance differential comparator with strobes microcircuit, with an operating temperature range of -40°C to +125°C for device 01, and an...
DSCC-VID-V62/03638 REV A
June 22, 2006
MICROCIRCUIT, LINEAR, DIFFERENTIAL COMPARATOR WITH STROBES, MONOLITHIC SILICON
This drawing documents the general requirements of a differential comparator with strobes, with an operating temperature range of -40°C to +125°C for device 01, and an operating temperature range of...
DSCC-VID-V62/03638
September 4, 2003
MICROCIRCUIT, LINEAR, DIFFERENTIAL COMPARATOR WITH STROBES, MONOLITHIC SILICON
A description is not available for this item.

References

This document references:
JEP95 BOOK 1 - Book One Registered and Standard Outlines for Solid State and Related Products
Published by JEDEC on March 1, 1997
PREFACE This Publication contains those solid state product outlines and other associated drawings that have been registered and assigned a JEDEC designation and are printed on white paper. Product...
This document references:
JEP95 BOOK 2 - Registered and Standard Outlines for Solid State and Related Products
Published by JEDEC on March 1, 1997
A description is not available for this item.
This document references:
JEDEC JESD 51-7 - High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
Published by JEDEC on February 1, 1999
This fixturing further defines the environment for thermal test of packaged microelectronic devices. Its function is to provide an alternate mounting surface for the analysis of heat flow in...
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