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BSI - BS EN IEC 60749-26 - TC

Tracked Changes (Redline) - Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

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Organization: BSI
Publication Date: 27 February 2020
Status: active
Page Count: 124
ICS Code (Semiconductor devices in general): 31.080.01

Document History

BS EN IEC 60749-26 - TC
February 27, 2020
Tracked Changes (Redline) - Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
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