DLA - SMD-5962-10207 REV C
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4MEG X 39-BIT (160M), RADIATION-HARDENED, DUAL VOLTAGE SRAM, MULTICHIP MODULE
active, Most Current
| Organization: | DLA |
| Publication Date: | 1 October 2021 |
| Status: | active |
| Page Count: | 23 |
scope:
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
SMD-5962-10207 REV C
October 1, 2021
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4MEG X 39-BIT (160M), RADIATION-HARDENED, DUAL VOLTAGE SRAM, MULTICHIP MODULE
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
October 19, 2020
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4MEG X 39-BIT (160M), RADIATION-HARDENED, DUAL VOLTAGE SRAM, MULTICHIP MODULE
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
September 12, 2014
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4MEG X 39-BIT (160M), RADIATION-HARDENED, DUAL VOLTAGE SRAM, MULTICHIP MODULE
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
January 2, 2013
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4MEG X 39-BIT (160M), RADIATION-HARDENED, DUAL VOLTAGE SRAM, MULTICHIP MODULE
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...