DLA - SMD-5962-06203 REV D
MICROCIRCUIT, MEMORY, DIGITAL, CMOS/SOI, RADIATION-HARDENED, 512K x 8-BIT, LOW VOLTAGE SRAM, MONOLITHIC SILICON
active, Most Current
| Organization: | DLA |
| Publication Date: | 14 March 2022 |
| Status: | active |
| Page Count: | 26 |
scope:
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
SMD-5962-06203 REV D
March 14, 2022
MICROCIRCUIT, MEMORY, DIGITAL, CMOS/SOI, RADIATION-HARDENED, 512K x 8-BIT, LOW VOLTAGE SRAM, MONOLITHIC SILICON
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
July 14, 2015
MICROCIRCUIT, MEMORY, DIGITAL, CMOS/SOI, RADIATION-HARDENED, 512K x 8-BIT, LOW VOLTAGE SRAM, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
March 6, 2014
MICROCIRCUIT, MEMORY, DIGITAL, CMOS/SOI, 512K x 8-BIT, RADIATIONHARDENED, LOW VOLTAGE SRAM, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
May 7, 2009
MICROCIRCUIT, MEMORY, DIGITAL, CMOS/SOI, 512K x 8-BIT, RADIATION-HARDENED, LOW VOLTAGE SRAM, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
July 18, 2006
MICROCIRCUIT, MEMORY, DIGITAL, CMOS/SOI, 512K X 8-BIT, RADIATION-HARDENED, LOW VOLTAGE SRAM, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...