ESD - SP5.3.4
Electrostatic Discharge Sensitivity Testing Charged Device Model (CDM) Testing Component Level Capacitively Coupled Transmission Line Pulsing (CC-TLP) as an Alternative CDM Characterization Method
active, Most Current
| Organization: | ESD |
| Publication Date: | 18 January 2022 |
| Status: | active |
| Page Count: | 24 |
scope:
This document establishes a procedure for testing components and microcircuits, such as integrated circuits, discrete semiconductor components, and electronic modules containing more than a single component, according to its susceptibility (sensitivity) to damage or degradation by exposure to a defined contact CDM like electrostatic discharge (ESD). This contact-based test method can be performed on packaged devices as well as on bare dies and wafers.
Purpose
The purpose of this document is to define a contact-based test method for a reliable, repeatable charged device model (CDM) characterization.
Document History
SP5.3.4
January 18, 2022
Electrostatic Discharge Sensitivity Testing Charged Device Model (CDM) Testing Component Level Capacitively Coupled Transmission Line Pulsing (CC-TLP) as an Alternative CDM Characterization Method
This document establishes a procedure for testing components and microcircuits, such as integrated circuits, discrete semiconductor components, and electronic modules containing more than a single...