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JEDEC JEP 119

A Procedure for Performing SWEAT

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Organization: JEDEC
Publication Date: 1 August 2003
Status: active
Page Count: 32
scope:

This document describes an algorithm for performing the Standard Wafer Level Electromigration Accelerated Test (SWEAT) method with computer controlled instrumentation. The algorithm requires a separate iterative technique (not provided) to calculate the force current for a given target time to failure.

This document does not specify what test structure to use with this procedure. However, users of this algorithm report its effectiveness on both straight-lines and via-terminated test structures. Some teststructures design features are provided in JESD87 and in ASTM 1259M - 96.

Document History

JEDEC JEP 119
August 1, 2003
A Procedure for Performing SWEAT
This document describes an algorithm for performing the Standard Wafer Level Electromigration Accelerated Test (SWEAT) method with computer controlled instrumentation. The algorithm requires a...
August 1, 2003
A Procedure for Performing SWEAT
This document describes an algorithm for performing the Standard Wafer Level Electromigration Accelerated Test (SWEAT) method with computer controlled instrumentation. The algorithm requires a...
January 1, 1994
Procedure for Executing SWEAT
A description is not available for this item.

References

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