DOD - SMD 5962-94526
MICROCIRCUIT, LINEAR, DUAL DIFFERENTIAL COMPARATOR, MONOLITHIC SILICON
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| Organization: | DOD |
| Publication Date: | 28 January 2016 |
| Status: | active |
| Page Count: | 19 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
December 15, 2022
MICROCIRCUIT, LINEAR, DUAL DIFFERENTIAL COMPARATOR, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Replaceability....
SMD 5962-94526
January 28, 2016
MICROCIRCUIT, LINEAR, DUAL DIFFERENTIAL COMPARATOR, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are...
April 17, 2009
MICROCIRCUIT, LINEAR, DUAL DIFFERENTIAL COMPARATOR, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
October 31, 2007
MICROCIRCUIT, LINEAR, DUAL DIFFERENTIAL COMPARATOR, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
May 9, 2007
MICROCIRCUIT, LINEAR, DUAL DIFFERENTIAL COMPARATOR, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
January 29, 2004
MICROCIRCUIT, LINEAR, DUAL DIFFERENTIAL COMPARATOR, MONOLITHIC SILICON
A description is not available for this item.
January 21, 1998
MICROCIRCUIT, LINEAR, DUAL DIFFERENTIAL COMPARATOR, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
November 18, 1997
MICROCIRCUIT, LINEAR, DUAL DIFFERENTIAL COMPARATOR, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
August 27, 1997
MICROCIRCUIT, LINEAR, DUAL DIFFERENTIAL COMPARATOR, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
July 21, 1994
MICROCIRCUIT, LINEAR, DUAL DIFFERENTIAL COMPARATOR, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...
February 9, 1994
MICROCIRCUIT, LINEAR, DUAL DIFFERENTIAL COMPARATOR, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...