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IEEE P1445 DRAFT

Draft Standard for Digital Test Interchange Format (DTIF)

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Organization: IEEE
Publication Date: 1 September 2016
Status: active
Page Count: 69
scope:

This standard defines digital automated test program generator (DATPG) output data formats and informational content for unit under test (UUT) models, stimulus and response patterns, fault dictionaries, and diagnostic probing. These outputs provide a standard exchange format for automatic test equipment (ATE).

Purpose

This standard is to be used as the standard definition of DATPG output formats and informational content.

Document History

December 7, 2016
Standard for Digital Test Interchange Format (DTIF)
This standard defines DATPG output data formats and informational content for UUT models, stimulus and response patterns, fault dictionaries, and diagnostic probing. These outputs provide a standard...
IEEE P1445 DRAFT
September 1, 2016
Draft Standard for Digital Test Interchange Format (DTIF)
This standard defines digital automated test program generator (DATPG) output data formats and informational content for unit under test (UUT) models, stimulus and response patterns, fault...
December 8, 1998
Standard for Digital Test Interchange Format (DTIF)
This standard defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit...
December 8, 1998
Standard for Digital Test Interchange Format (DTIF)
A description is not available for this item.
December 8, 1998
Standard for Digital Test Interchange Format (DTIF)
FOREWORD A digital automated test program generator (DATPG) produces test pattern and diagnostic data that can be used for testing printed circuit assemblies on automatic test equipment (ATE). The...

References

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