Standard for Digital Test Interchange Format (DTIF)
|Publication Date:||8 December 1998|
This standard defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
The purpose of this standard is to provide a standard output format for test data generated by a DATPG. A DATPG produces test patterns and fault diagnostic data for ATE. This data is used in applications such as board-level assemblies where diagnostic data interchange is important.