DOD - SMD 5962-89601
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE MONOLITHIC SILICON
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| Organization: | DOD |
| Publication Date: | 14 June 2017 |
| Status: | inactive |
| Page Count: | 28 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device classes M, B and Q) and space application (device classes S and V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
June 5, 2019
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE MONOLITHIC SILICON
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device classes M, B and Q) and space application (device classes S and V). A choice of case outlines...
SMD 5962-89601
June 14, 2017
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes M, B and Q) and space application (device classes S and V). A choice of case outlines and lead...
December 19, 2012
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes M, B and Q) and space application (device classes S and V). A choice of case outlines and lead...
November 10, 2011
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes M, B and Q) and space application (device classes S and V). A choice of case outlines and lead...
March 18, 2005
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes M, B and Q) and space application (device classes S and V). A choice of case outlines and lead...
September 24, 2002
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
A description is not available for this item.
July 8, 1997
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
A description is not available for this item.
February 26, 1993
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and...
July 10, 1992
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
A description is not available for this item.
May 18, 1989
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
A description is not available for this item.