DLA - SMD-5962-89601 REV A
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
inactive
| Organization: | DLA |
| Publication Date: | 10 July 1992 |
| Status: | inactive |
| Page Count: | 30 |
Document History
June 5, 2019
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE MONOLITHIC SILICON
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device classes M, B and Q) and space application (device classes S and V). A choice of case outlines...
June 14, 2017
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes M, B and Q) and space application (device classes S and V). A choice of case outlines and lead...
December 19, 2012
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes M, B and Q) and space application (device classes S and V). A choice of case outlines and lead...
November 10, 2011
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes M, B and Q) and space application (device classes S and V). A choice of case outlines and lead...
March 18, 2005
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes M, B and Q) and space application (device classes S and V). A choice of case outlines and lead...
September 24, 2002
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
A description is not available for this item.
July 8, 1997
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
A description is not available for this item.
February 26, 1993
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and...
SMD-5962-89601 REV A
July 10, 1992
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
A description is not available for this item.
May 18, 1989
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL POSITIVE EDGED-TRIGGERED D-TYPE FLIP-FLOP WITH THREE STATE OUTPUTS AND TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
A description is not available for this item.