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DOD - SMD 5962-94758

MICROCIRCUIT, DIGITAL, SERIAL MICROCODED MULTI-MODE INTELLIGENT TERMINAL, SILICON

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Organization: DOD
Publication Date: 30 July 2007
Status: inactive
Page Count: 43
scope:

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Document History

SMD 5962-94758
November 12, 2020
MICROCIRCUIT, DIGITAL, SERIAL MICROCODED MULTI-MODE INTELLIGENT TERMINAL, SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
SMD 5962-94758
October 7, 2015
MICROCIRCUIT, DIGITAL, SERIAL MICROCODED MULTI-MODE INTELLIGENT TERMINAL, SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
SMD 5962-94758
June 4, 2014
MICROCIRCUIT, DIGITAL, SERIAL MICROCODED MULTI-MODE INTELLIGENT TERMINAL, SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
SMD 5962-94758
March 4, 2013
MICROCIRCUIT, DIGITAL, SERIAL MICROCODED MULTI-MODE INTELLIGENT TERMINAL, SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q) and space application (device class V). A choice of case outlines and lead finishes are...
SMD 5962-94758
April 17, 2012
MICROCIRCUIT, DIGITAL, SERIAL MICROCODED MULTI-MODE INTELLIGENT TERMINAL, SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Replaceability....
SMD 5962-94758
February 1, 2011
MICROCIRCUIT, DIGITAL, SERIAL MICROCODED MULTI-MODE INTELLIGENT TERMINAL, SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD 5962-94758
July 30, 2007
MICROCIRCUIT, DIGITAL, SERIAL MICROCODED MULTI-MODE INTELLIGENT TERMINAL, SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-94758 REV D
April 11, 2001
MICROCIRCUIT, DIGITAL, SERIAL MICROCODED MULTI-MODE INTELLIGENT TERMINAL, SILICON
A description is not available for this item.
SMD-5962-94758 REV C
December 21, 2000
MICROCIRCUIT, DIGITAL, SERIAL MICROCODED MULTI-MODE INTELLIGENT TERMINAL, SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Microcircuits covered by...
SMD-5962-94758 REV B
April 12, 1999
MICROCIRCUIT, DIGITAL, SERIAL MICROCODED MULTI-MODE INTELLIGENT TERMINAL, SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Microcircuits covered by...
SMD-5962-94758 REV A
January 17, 1996
MICROCIRCUIT, DIGITAL, SERIAL MICROCODED MULTI-MODE INTELLIGENT TERMINAL, SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-94758
March 28, 1995
MICROCIRCUIT, DIGITAL, SERIAL MICROCODED MULTI-MODE INTELLIGENT TERMINAL, SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...
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References

This document references:
IEEE 1149.1 - Test Access Port and Boundary-Scan Architecture
Published by IEEE on February 6, 2013
This standard defines test logic that can be included in an integrated circuit to provide standardized approaches to: - Testing the interconnections between integrated circuits once they have been...
This document references:
MIL-HDBK-103 - LIST OF STANDARD MICROCIRCUIT DRAWINGS
Published by NPFC on March 8, 2021
Purpose. The Standard Microcircuit Drawing Program (SMDP) is directly under the auspices of the DoD Parts Management Program (PMP). The PMP is implemented by MIL-HDBK-512, "Parts Management." The PMP...
This document references:
MIL-HDBK-1553 - Multiplex Application Handbook
Published by NPFC on May 3, 2013
A description is not available for this item.
This document references:
MIL-HDBK-780D VALID NOTICE 1 - Standard Microcircuit Drawings
Published by DLA on December 28, 2021
A description is not available for this item.
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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