CENELEC - EN 60749-6
Semiconductor Devices Mechanical and Climatic Test Methods Part 6: Storage at High Temperature
inactive
| Organization: | CENELEC |
| Publication Date: | 1 August 2002 |
| Status: | inactive |
| Page Count: | 8 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
June 1, 2017
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
The purpose of this part of IEC 60749 is to test and determine the effect on all solid state electronic devices of storage at elevated temperature without electrical stress applied. This test is...
EN 60749-6
August 1, 2002
Semiconductor Devices Mechanical and Climatic Test Methods Part 6: Storage at High Temperature
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