DOD - SMD 5962-07201
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ERASEABLE (EE) PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
inactive
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| Organization: | DOD |
| Publication Date: | 17 August 2007 |
| Status: | inactive |
| Page Count: | 21 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
September 26, 2022
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ERASEABLE (EE) PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Replaceability....
December 16, 2015
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ERASEABLE (EE) PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD 5962-07201
August 17, 2007
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ERASEABLE (EE) PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...