DLA - SMD-5962-07201 REV B
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ERASEABLE (EE) PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
active, Most Current
| Organization: | DLA |
| Publication Date: | 26 September 2022 |
| Status: | active |
| Page Count: | 22 |
scope:
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics... View More
Document History
SMD-5962-07201 REV B
September 26, 2022
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ERASEABLE (EE) PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Replaceability....
December 16, 2015
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ERASEABLE (EE) PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
August 17, 2007
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ELECTRICALLY ERASEABLE (EE) PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...