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IEC/TR 61967-1-1

Integrated circuits – Measurement of electromagnetic emissions – Part 1-1: General conditions and definitions – Near-field scan data exchange format

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Organization: IEC
Publication Date: 1 May 2010
Status: inactive
Page Count: 108
ICS Code (Integrated circuits. Microelectronics): 31.200
scope:

This part of IEC 61967 provides guidance for exchanging data generated by near-field scan measurements.

The described exchange format could also be used for near-field scan data generated by simulation software.

It should be noted that, although it has been developed for near-field scan, its use is not restricted to this application.

The exchange format can be applied to emission, immunity and impulse immunity near-field scan data in the frequency and time domains.

The scope of this technical report includes neither the methods used for the measurements or simulations, nor the software and algorithms used for generating the exchange file or for processing or viewing the data contained therein.

Document History

August 1, 2015
Integrated circuits – Measurement of electromagnetic emissions – Part 1-1: General conditions and definitions – Near-field scan data exchange format
This part of IEC 61967 provides guidance for exchanging data generated by near-field scan measurements. The described exchange format could also be used for near-field scan data generated by...
IEC/TR 61967-1-1
May 1, 2010
Integrated circuits – Measurement of electromagnetic emissions – Part 1-1: General conditions and definitions – Near-field scan data exchange format
This part of IEC 61967 provides guidance for exchanging data generated by near-field scan measurements. The described exchange format could also be used for near-field scan data generated by...

References

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