IEC 60191-6-20
Mechanical standardization of semiconductor devices – Part 6-20: General rules for the preparation of outline drawings of surface mounted semiconductor device packages – Measuring methods for package dimensions of small outline J-lead packages (SOJ)
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| Organization: | IEC |
| Publication Date: | 1 August 2010 |
| Status: | active |
| Page Count: | 26 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This part of IEC 60191 specifies methods to measure package dimensions of small outline Jlead- packages (SOJ), package outline form E in accordance with IEC 60191-4.
Document History
IEC 60191-6-20
August 1, 2010
Mechanical standardization of semiconductor devices – Part 6-20: General rules for the preparation of outline drawings of surface mounted semiconductor device packages – Measuring methods for package dimensions of small outline J-lead packages (SOJ)
This part of IEC 60191 specifies methods to measure package dimensions of small outline Jlead- packages (SOJ), package outline form E in accordance with IEC 60191-4.