IEC 62951-4
Semiconductor devices – Flexible and stretchable semiconductor devices – Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
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| Organization: | IEC |
| Publication Date: | 1 February 2019 |
| Status: | active |
| Page Count: | 30 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
scope:
This part of IEC 62951 specifies an evaluation method of the bending fatigue properties of conductive thin film and flexible substrate for the application at flexible semiconductor devices. The films include any films deposited or bonded onto a non-conductive flexible substrate such as thin metal film, transparent conducting electrode, and thin silicon film used for flexible semiconductor devices. The electrical and mechanical behaviours of films on the substrate are evaluated. The fatigue test methods include dynamic bending fatigue test and static bending fatigue test.
Document History
IEC 62951-4
February 1, 2019
Semiconductor devices – Flexible and stretchable semiconductor devices – Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
This part of IEC 62951 specifies an evaluation method of the bending fatigue properties of conductive thin film and flexible substrate for the application at flexible semiconductor devices. The films...