DLA - MIL-STD-750-4 CHANGE 3
TEST METHOD STANDARD DIODE ELECTRICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 4: TEST METHODS 4000 THROUGH 4999
|Publication Date:||30 December 2019|
Part 4 of this test method standard establishes uniform test methods for the basic electrical testing of semiconductor diodes to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts.
The test methods are designated by numbers assigned in accordance with the following system:
Classification of tests.
The electrical test methods included in this part of a mulitpart test method standard are divided into four classes: Test methods numbered 4000 to 4081 cover electrical characteristics tests for diodes; those numbered 4101 to 4151 cover electrical characteristics tests for microwave diodes; those numbered 4201 to 4231 cover electrical characteristics tests for thyristors; and those numbered 4301 to 4331 cover electrical characteristics tests for tunnel diodes.
Test method revisions.
Test method revisions are numbered consecutively using a period to separate the test method number and the revision number. For example, 4011.4 designates the fourth revision of test method 4011.
Method of reference.
When applicable, test methods contained herein should be referenced in the individual specification, specification sheet, or procurement documents by specifying the test method number and the details specified in the summary of the applicable test method. The basic standard should be referenced and not the individual part or parts of this standard. To avoid the necessity for changing documents that refer to test methods of this standard, the revision number of a test method should not be used when referencing individual test methods. For example, use 4011 as a reference versus 4011.4.
The intended use of this test method standard is to establish appropriate conditions for testing semiconductor devices to give test results that simulate the actual service conditions existing in... View More
The intended use of this test method standard is to establish appropriate conditions for testing semiconductor devices to give test results that simulate the actual service conditions existing in the field. This test method standard has been prepared to provide uniform test methods, controls, and procedures for determining with predictability the suitability of such devices within military, aerospace and special application equipment.View Less