scope:

Purpose. Part 4 of this test method standard establishes uniform test methods for the basic electrical testing of semiconductor diodes to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.

Numbering system. The test methods are designated by numbers assigned in accordance with the following system:

Classification of tests. The electrical test methods included in this part are numbered 4000 to 4999 inclusive.

Test method revisions. Test method revisions are numbered consecutively using a period to separate the test method number and the revision number. For example, 4011.4 designates the fourth revision of test method 4011.

Method of reference. When applicable, test methods contained herein shall be referenced in the individual specification or specification sheet by specifying the test method number, and the details required in the summary of the applicable test method shall be listed. To avoid the necessity for changing specifications that refer to this test methods of this standard, the revision number should not be used when referencing test methods. (For example: Use 4011 versus 4011.4.)

intended Use: