NPFC - MIL-STD-750-4

TEST METHOD STANDARD DIODE ELECTRICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 4: TEST METHODS 4000 THROUGH 4999

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Organization:	NPFC
Publication Date:	15 August 2014
Status:	inactive
Page Count:	168

scope:

Purpose. Part 4 of this test method standard establishes uniform test methods for the basic electrical testing of semiconductor diodes to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.

Numbering system. The test methods are designated by numbers assigned in accordance with the following system:

Classification of tests. The electrical test methods included in this part are numbered 4000 to 4999 inclusive.

Test method revisions. Test method revisions are numbered consecutively using a period to separate the test method number and the revision number. For example, 4011.4 designates the fourth revision of test method 4011

intended Use:

The intended use of this test method standard is to establish appropriate conditions for testing semiconductor devices to give test results that simulate the actual service conditions existing in... View More