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DLA - SMD-5962-95713 REV D

MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS PROGRAMMABLE INTERVAL TIMER, MONOLITHIC SILICON

active, Most Current
Organization: DLA
Publication Date: 24 March 2022
Status: active
Page Count: 16
scope:

Scope.

This drawing documents three product assurance class levels consisting of high reliability (device classes Q), space application (device class V) and for appropriate satellite and similar applications (device class T). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. For device class T, the user is encouraged to review the manufacturer's Quality Management (QM) plan as part of their evaluation of these parts and their acceptability in the intended application.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics... View More

Document History

SMD-5962-95713 REV D
March 24, 2022
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS PROGRAMMABLE INTERVAL TIMER, MONOLITHIC SILICON
Scope. This drawing documents three product assurance class levels consisting of high reliability (device classes Q), space application (device class V) and for appropriate satellite and similar...
July 15, 2015
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS PROGRAMMABLE INTERVAL TIMER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
April 17, 2007
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS PROGRAMMABLE INTERVAL TIMER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
July 8, 1998
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, PROGRAMMABLE INTERVAL TIMER, MONOLITHIC SILICON
DD Form 1695, APR 92 Previous editions are obsolete.
January 16, 1996
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, PROGRAMMABLE INTERVAL TIMER, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...

References

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