DLA - SMD-5962-95713 REV A
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, PROGRAMMABLE INTERVAL TIMER, MONOLITHIC SILICON
inactive
| Organization: | DLA |
| Publication Date: | 8 July 1998 |
| Status: | inactive |
| Page Count: | 19 |
scope:
DD Form 1695, APR 92
Previous editions are obsolete.
Document History
March 24, 2022
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS PROGRAMMABLE INTERVAL TIMER, MONOLITHIC SILICON
Scope.
This drawing documents three product assurance class levels consisting of high reliability (device classes Q), space application (device class V) and for appropriate satellite and similar...
July 15, 2015
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS PROGRAMMABLE INTERVAL TIMER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
April 17, 2007
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS PROGRAMMABLE INTERVAL TIMER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-95713 REV A
July 8, 1998
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, PROGRAMMABLE INTERVAL TIMER, MONOLITHIC SILICON
DD Form 1695, APR 92
Previous editions are obsolete.
January 16, 1996
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, PROGRAMMABLE INTERVAL TIMER, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...