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DLA - SMD-5962-18220 REV B

MICROCIRCUIT, BiCMOS, RADIATION HARDENED, SINGLE P-CHANNEL, 3.5 A CONTINUOUS CURRENT (LOAD SWITCH) eFuse, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 4 April 2022
Status: inactive
Page Count: 32
scope:

Scope.

This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice o f Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

General... View More

Document History

December 14, 2023
MICROCIRCUIT, BiCMOS, RADIATION HARDENED, SINGLE P-CHANNEL, 3.5 A CONTINUOUS CURRENT (LOAD SWITCH) eFuse, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. General applications: The...
SMD-5962-18220 REV B
April 4, 2022
MICROCIRCUIT, BiCMOS, RADIATION HARDENED, SINGLE P-CHANNEL, 3.5 A CONTINUOUS CURRENT (LOAD SWITCH) eFuse, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. General applications: The...
December 13, 2021
MICROCIRCUIT, BiCMOS, RADIATION HARDENED, SINGLE P-CHANNEL, 3.5 A CONTINUOUS CURRENT (LOAD SWITCH) eFuse, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
August 23, 2021
MICROCIRCUIT, BiCMOS, SINGLE CHANNEL, 3.5-A LOAD SWITCH, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...

References

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