DLA - SMD-5962-96827 REV D
MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT DIAGNOSTIC SCAN REGISTER, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
active, Most Current
| Organization: | DLA |
| Publication Date: | 24 August 2022 |
| Status: | active |
| Page Count: | 19 |
scope:
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics... View More
Document History
SMD-5962-96827 REV D
August 24, 2022
MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT DIAGNOSTIC SCAN REGISTER, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
September 21, 2016
MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT DIAGNOSTIC SCAN REGISTER, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
May 14, 2010
MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT DIAGNOSTIC SCAN REGISTER, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
February 11, 2003
MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT DIAGNOSTIC SCAN REGISTER, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
A description is not available for this item.
March 22, 1996
MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT DIAGNOSTIC SCAN REGISTER, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...