DLA - SMD-5962-96827 REV A
MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT DIAGNOSTIC SCAN REGISTER, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
inactive
| Organization: | DLA |
| Publication Date: | 11 February 2003 |
| Status: | inactive |
| Page Count: | 20 |
Document History
August 24, 2022
MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT DIAGNOSTIC SCAN REGISTER, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
September 21, 2016
MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT DIAGNOSTIC SCAN REGISTER, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
May 14, 2010
MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT DIAGNOSTIC SCAN REGISTER, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-96827 REV A
February 11, 2003
MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT DIAGNOSTIC SCAN REGISTER, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
A description is not available for this item.
March 22, 1996
MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT DIAGNOSTIC SCAN REGISTER, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...