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DLA - SMD-5962-96827

MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT DIAGNOSTIC SCAN REGISTER, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 22 March 1996
Status: inactive
Page Count: 19
scope:

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN is as shown in the following example:

Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) identify the circuit function as follows:

Device type Generic number Circuit function 01 29FCT818AT 8-bit diagnostic scan register, TTL compatible inputs and limited output voltage swing

The device class designator is a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535

The case outline(s) are as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style L GDIP3-T24 or CDIP4-T24 24 Dual-in-line 3 CQCC1-N28 28 Leadless chip carrier

The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M.

Supply voltage range (VCC) . . . . . . . . . . . . . . . . . . . −0.5 V dc to +7.0 V dc DC input voltage range (VIN) . . . . . . . . . . . . . . . . . . −0.5 V dc to VCC + 0.5 V dc 4/ DC output voltage range (VOUT) . . . . . . . . . . . . . . . . . −0.5 V dc to VCC + 0.5 V dc 4/ DC input clamp current (IIK) (VIN = −0.5) . . . . . . . . . . . . −20 mA DC output clamp current (IOK) (VOUT = −0.5 V and +7.0 V) . . . . ±20 mA DC output source current (IOH) (per output) . . . . . . . . . . . −30 mA DC output sink current (IOL) (per output) . . . . . . . . . . . +70 mA DC VCC current (ICC) . . . . . . . . . . . . . . . . . . . . . . ±268 mA Ground current (IGND) . . . . . . . . . . . . . . . . . . . . . +588 mA Storage temperature range (TSTG) . . . . . . . . . . . . . . . . −65°C to +150°C Case temperature under bias (TBIAS) . . . . . . . . . . . . . . . −65°C to +135°C Lead temperature (soldering, 10 seconds) . . . . . . . . . . . . +300°C Thermal resistance, junction-to-case (ΘJC) . . . . . . . . . . . See MIL-STD-1835 Junction temperature (TJ) . . . . . . . . . . . . . . . . . . . . +175°C Maximum power dissipation (PD). . . . . . . . . . . . . . . . . . 500 mW

Supply voltage range VCC) . . . . . . . . . . . . . . . . . . . +4.5 V dc to +5.5 V dc Input voltage range (VIN) . . . . . . . . . . . . . . . . . . . +0.0 V dc to VCC Output voltage range (VOUT) . . . . . . . . . . . . . . . . . . +0.0 V dc to VCC Maximum low level input voltage (VIL) . . . . . . . . . . . . . 0.8 V Minimum high level input voltage (VIH) . . . . . . . . . . . . . 2.0 V Case operating temperature range (TC) . . . . . . . . . . . . . −55°C to +125°C Maximum input rise or fall rate (Δt/ΔV): (from VIN = 0.3 V to 2.7 V, 2.7 V to 0.3 V) . . . . . . . . . 5 ns/V Maximum high level output current (IOH) . . . . . . . . . . . . −3 mA Maximum low level output current (IOL) . . . . . . . . . . . . . 20 mA

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) . . . . . . . . . . XX percent 5/

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

August 24, 2022
MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT DIAGNOSTIC SCAN REGISTER, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
September 21, 2016
MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT DIAGNOSTIC SCAN REGISTER, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
May 14, 2010
MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT DIAGNOSTIC SCAN REGISTER, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
February 11, 2003
MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT DIAGNOSTIC SCAN REGISTER, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-96827
March 22, 1996
MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT DIAGNOSTIC SCAN REGISTER, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...

References

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