DLA - SMD-5962-96827
MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT DIAGNOSTIC SCAN REGISTER, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
| Organization: | DLA |
| Publication Date: | 22 March 1996 |
| Status: | inactive |
| Page Count: | 19 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.
The PIN is as shown in the following example:
Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
The device type(s) identify the circuit function as follows:
Device type Generic number Circuit function 01 29FCT818AT 8-bit diagnostic scan register, TTL compatible inputs and limited output voltage swing
The device class designator is a single letter identifying the product assurance level as follows:
Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Q or V Certification and qualification to MIL-PRF-38535
The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter Descriptive designator Terminals Package style L GDIP3-T24 or CDIP4-T24 24 Dual-in-line 3 CQCC1-N28 28 Leadless chip carrier
The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M.
Supply voltage range (VCC) . . . . . . . . . . . . . . . . . . . −0.5 V dc to +7.0 V dc DC input voltage range (VIN) . . . . . . . . . . . . . . . . . . −0.5 V dc to VCC + 0.5 V dc 4/ DC output voltage range (VOUT) . . . . . . . . . . . . . . . . . −0.5 V dc to VCC + 0.5 V dc 4/ DC input clamp current (IIK) (VIN = −0.5) . . . . . . . . . . . . −20 mA DC output clamp current (IOK) (VOUT = −0.5 V and +7.0 V) . . . . ±20 mA DC output source current (IOH) (per output) . . . . . . . . . . . −30 mA DC output sink current (IOL) (per output) . . . . . . . . . . . +70 mA DC VCC current (ICC) . . . . . . . . . . . . . . . . . . . . . . ±268 mA Ground current (IGND) . . . . . . . . . . . . . . . . . . . . . +588 mA Storage temperature range (TSTG) . . . . . . . . . . . . . . . . −65°C to +150°C Case temperature under bias (TBIAS) . . . . . . . . . . . . . . . −65°C to +135°C Lead temperature (soldering, 10 seconds) . . . . . . . . . . . . +300°C Thermal resistance, junction-to-case (ΘJC) . . . . . . . . . . . See MIL-STD-1835 Junction temperature (TJ) . . . . . . . . . . . . . . . . . . . . +175°C Maximum power dissipation (PD). . . . . . . . . . . . . . . . . . 500 mW
Supply voltage range VCC) . . . . . . . . . . . . . . . . . . . +4.5 V dc to +5.5 V dc Input voltage range (VIN) . . . . . . . . . . . . . . . . . . . +0.0 V dc to VCC Output voltage range (VOUT) . . . . . . . . . . . . . . . . . . +0.0 V dc to VCC Maximum low level input voltage (VIL) . . . . . . . . . . . . . 0.8 V Minimum high level input voltage (VIH) . . . . . . . . . . . . . 2.0 V Case operating temperature range (TC) . . . . . . . . . . . . . −55°C to +125°C Maximum input rise or fall rate (Δt/ΔV): (from VIN = 0.3 V to 2.7 V, 2.7 V to 0.3 V) . . . . . . . . . 5 ns/V Maximum high level output current (IOH) . . . . . . . . . . . . −3 mA Maximum low level output current (IOL) . . . . . . . . . . . . . 20 mA
Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) . . . . . . . . . . XX percent 5/
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
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