DLA - SMD-5962-94567 REV B
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, X 9 CLOCKED FIFO, MONOLITHIC SILICON
active, Most Current
| Organization: | DLA |
| Publication Date: | 22 August 2023 |
| Status: | active |
| Page Count: | 23 |
scope:
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics... View More
Document History
SMD-5962-94567 REV B
August 22, 2023
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, X 9 CLOCKED FIFO, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Replaceability....
April 5, 2013
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, X 9 CLOCKED FIFO’S, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
February 20, 1996
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, X 9 CLOCKED FIFO'S, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...