DLA - SMD-5962-06261 REV C
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, RADIATION-HARDENED, 512K X 32-BIT (16MB) WITH EMBEDDED EDAC, LOW VOLTAGE SRAM, MONOLITHIC SILICON
inactive
| Organization: | DLA |
| Publication Date: | 13 May 2013 |
| Status: | inactive |
| Page Count: | 29 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
October 3, 2023
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, RADIATION-HARDENED, 512K X 32-BIT (16MB) WITH EMBEDDED EDAC, LOW VOLTAGE SRAM, MONOLITHIC SILICON
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
May 11, 2018
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, RADIATION-HARDENED, 512K X 32-BIT (16MB) WITH EMBEDDED EDAC, LOW VOLTAGE SRAM, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
SMD-5962-06261 REV C
May 13, 2013
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, RADIATION-HARDENED, 512K X 32-BIT (16MB) WITH EMBEDDED EDAC, LOW VOLTAGE SRAM, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
March 7, 2011
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 512K X 32-BIT (16M) with embedded EDAC, RADIATIONHARDENED, LOW VOLTAGE SRAM, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
July 7, 2010
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 512K X 32-BIT (16M) with embedded EDAC, RADIATION-HARDENED, LOW VOLTAGE SRAM, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
February 23, 2009
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 512K X 32-BIT (16M) with embedded EDAC, RADIATION-HARDENED, LOW VOLTAGE SRAM, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...