IPC - TM-650 2.6.25
Conductive Anodic Filament (CAF) Resistance Test: X-Y Axis
inactive
| Organization: | IPC |
| Publication Date: | 1 May 2012 |
| Status: | inactive |
| Page Count: | 11 |
Document History
February 1, 2021
Conductive Anodic Filament (CAF) Resistance Test: X-Y Axis
This test method provides a means to assess the propensity for conductive anodic filament (CAF) growth and other forms of electrochemical migration failure modes within a printed board (PB). This...
April 1, 2016
Conductive Anodic Filament (CAF) Resistance Test: X-Y Axis
This test method provides a means to assess the propensity for conductive anodic filament (CAF) growth, a form of electrochemical migration, and similar conductive filament formation (CFF) laminate...
TM-650 2.6.25
May 1, 2012
Conductive Anodic Filament (CAF) Resistance Test: X-Y Axis
A description is not available for this item.
November 1, 2003
Conductive Anodic Filament (CAF) Resistance Test: X-Y Axis
This test method provides a means to assess the propensity for conductive anodic filament (CAF) growth, a form of electrochemical migration within a printed wiring board (PWB). Conductive anodic...