NPFC - MIL-PRF-19500/741
SEMICONDUCTOR DEVICE, FIELD EFFECT, RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTOR DIE, N-CHANNEL AND P-CHANNEL, SILICON, VARIOUS TYPES, JANHC AND JANKC
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| Organization: | NPFC |
| Publication Date: | 30 January 2009 |
| Status: | inactive |
| Page Count: | 1 |
Document History
November 18, 2019
TRANSISTOR, DIE, FIELD EFFECT, RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) N-CHANNEL AND P-CHANNEL, SILICON, VARIOUS TYPES, JANHC AND JANKC
Scope.
This specification covers the performance requirements for N-channel and P-channel, enhancementmode, MOSFET, radiation hardened (total dose and single event effects (SEE)), power transistor...
April 13, 2018
TRANSISTOR, DIE, FIELD EFFECT, RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) N-CHANNEL AND P-CHANNEL, SILICON, VARIOUS TYPES, JANHC AND JANKC
This specification covers the performance requirements for N-channel and P-channel, enhancementmode, MOSFET, radiation hardened (total dose and single event effects (SEE)), power transistor die. Two...
January 30, 2009
SEMICONDUCTOR DEVICE, FIELD EFFECT, RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTOR DIE, N-CHANNEL AND P-CHANNEL, SILICON, VARIOUS TYPES, JANHC AND JANKC
This specification covers the performance requirements for N-channel and P-channel, enhancementmode, MOSFET, radiation hardened (total dose and single event effects (SEE)), power transistor die. Two...
MIL-PRF-19500/741
January 30, 2009
SEMICONDUCTOR DEVICE, FIELD EFFECT, RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTOR DIE, N-CHANNEL AND P-CHANNEL, SILICON, VARIOUS TYPES, JANHC AND JANKC
A description is not available for this item.
March 14, 2006
SEMICONDUCTOR DEVICE, FIELD EFFECT, RADIATION HARDENED (TOTAL DOSE AND SINGLE EVENT EFFECTS) TRANSISTOR DIE, N-CHANNEL AND P-CHANNEL, SILICON, VARIOUS TYPES, JANHC AND JANKC
This specification covers the performance requirements for N-channel and P-channel, enhancementmode, MOSFET, radiation hardened (total dose and single event effects (SEE)), power transistor die. Two...