DOD - SMD 5962-95608
MICROCIRCUIT, MEMORY, DIGITAL, 1K X 36 DUAL PORT CLOCKED FIFO, MONOLITHIC SILICON
inactive
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| Organization: | DOD |
| Publication Date: | 20 June 2014 |
| Status: | inactive |
| Page Count: | 33 |
scope:
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device class Q), and nontraditional performance environment (device class N). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. For device class N, the user is cautioned to assure that the device is appropriate for the application environment.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
May 14, 2019
MICROCIRCUIT, MEMORY, DIGITAL, 1K X 36 DUAL PORT CLOCKED FIFO, MONOLITHIC SILICON
Scope.
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device class Q), and nontraditional performance environment...
SMD 5962-95608
June 20, 2014
MICROCIRCUIT, MEMORY, DIGITAL, 1K X 36 DUAL PORT CLOCKED FIFO, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device class Q), and nontraditional performance environment (device...
April 4, 2006
MICROCIRCUIT, MEMORY, DIGITAL, 1K X 36 DUAL PORT CLOCKED FIFO, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q), and nontraditional performance environment...
March 18, 1997
MICROCIRCUIT, MEMORY, DIGITAL, 1K X 36 DUAL PORT CLOCKED FIFO, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q), and nontraditional performance environment...
September 19, 1995
MICROCIRCUIT, MEMORY, DIGITAL, 1K X 36 DUAL PORT CLOCKED FIFO, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Three product assurance classes consisting of space application (device class V), military high...