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DOD - SMD 5962-96605

MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX D-TYPE FLIP-FLOP, MONOLITHIC SILICON

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Organization: DOD
Publication Date: 28 February 1997
Status: inactive
Page Count: 26
scope:

This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535 and the manufacturers approved QM plan for use in monolithic microcircuits, multichip modules (MCMs), hybrids, electronic modules, or devices using chip and wire designs in accordance with MIL-PRF-38534 are specified herein. Two product assurance classes consisting of military high reliability (device class Q) and space application (device Class V) are reflected in the Part or Identification Number (PIN). When available a choice of Radiation Hardiness Assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes Q and V RHA identified die shall meet the MIL-PRF-38535 specified RHA levels. A dash (−) indicates a non-RHA die.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function 01 40174B Radiation Hardened, CMOS, hex D-type flip flop 02 40174BN Radiation Hardened, CMOS, hex D-type flip flop, neutron irradiated die

Device class Device requirements documentation Q or V Certification and qualification to the die requirements of MIL-PRF-38535.

The die details designation shall be a unique letter which designates the die's physical dimensions, bonding pad location(s) and related electrical function(s), interface materials, and other assembly related information, for each product and variant supplied to this appendix.

Die Types Figure number 01, 02 A-1

Die Types Figure number 01, 02 A-1

Die Types Figure number 01, 02 A-1

01, 02 A-1

See paragraph 1.3 within the body of this drawing for details.

See paragraph 1.4 within the body of this drawing for details.

intended Use:

Microcircuit die conforming to this drawing are intended for use in microcircuits built in accordance with MIL-PRF-38535 or MIL-PRF-38534 for government microcircuit applications (original... View More

Document History

June 3, 2019
MICROCIRCUIT, DIGITAL, CMOS, RADIATION HARDENED, HEX D-TYPE FLIP-FLOP, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
June 16, 2010
MICROCIRCUIT, DIGITAL, CMOS, RADIATION HARDENED, HEX D-TYPE FLIP-FLOP, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
November 18, 2003
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX D-TYPE FLIP-FLOP, MONOLITHIC SILICON
A description is not available for this item.
August 18, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX D-TYPE FLIP-FLOP, MONOLITHIC SILICON
A description is not available for this item.
SMD 5962-96605
February 28, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX D-TYPE FLIP-FLOP, MONOLITHIC SILICON
This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535...
December 5, 1995
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX D-TYPE FLIP-FLOP, MONOLITHIC SILICON
A description is not available for this item.

References

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