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DLA - SMD-5962-96605

MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX D-TYPE FLIP-FLOP, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 5 December 1995
Status: inactive
Page Count: 16

Document History

June 3, 2019
MICROCIRCUIT, DIGITAL, CMOS, RADIATION HARDENED, HEX D-TYPE FLIP-FLOP, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
June 16, 2010
MICROCIRCUIT, DIGITAL, CMOS, RADIATION HARDENED, HEX D-TYPE FLIP-FLOP, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
November 18, 2003
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX D-TYPE FLIP-FLOP, MONOLITHIC SILICON
A description is not available for this item.
August 18, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX D-TYPE FLIP-FLOP, MONOLITHIC SILICON
A description is not available for this item.
February 28, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX D-TYPE FLIP-FLOP, MONOLITHIC SILICON
This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535...
SMD-5962-96605
December 5, 1995
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX D-TYPE FLIP-FLOP, MONOLITHIC SILICON
A description is not available for this item.

References

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