UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

DLA - SMD-5962-93239

MICROCIRCUIT, DIGITAL, CMOS, SCAN PATH LINKERS WITH 4-BIT ID BUS, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 20 January 1994
Status: inactive
Page Count: 19
scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q, and M) and space application (device class V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes M RHA marked devices shall meet the MIL-I-38535 appendix A specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function 01 54ACT8997 Scan path linkers with 4-bit identification buses

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 Q or V Certification and qualification to MIL-I-38535

The case outline(s) shall be as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style X CDIP3-T28 or GDIP4-T28 28 Dual-in-line package 3 CQCC1-N28 28 Square chip carrier package

The lead finish shall be as specified in MIL-STD-883 (see 3.1 herein) for class M or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Supply voltage range (VCC)- - - - - - - - - - - - - - - - −0.5 V dc to +7.0 V dc Input voltage range (VIN) - - - - - - - - - - - - - - - - −0.5 V dc to VCC +0.5 V dc Output voltage range (VOUT) - - - - - - - - - - - - - - - −0.5V dc to VCC +0.5 V dc Continuous output current (IOUT)- - - - - - - - - - - - - ±25 mA Input clamp current (IIK) - - - - - - - - - - - - - - - - ±20 mA Output clamp current (IOK)- - - - - - - - - - - - - - - - ±20 mA Storage temperature range - - - - - - - - - - - - - - - - −65°C to +150°C Lead temperature (soldering, 10 seconds) - - - - - - - - +300°C Junction temperature (TJ) - - - - - - - - - - - - - - - - +175°C Maximum power dissipation (PD): 2/- - - - - - - - - - - - 193 mW Thermal resistance, junction-to-case (ΘJC) - - - - - - - See MIL-STD-1835

Supply voltage range (VCC)- - - - - - - - - - - - - - - - 4.5 V dc to +5.5 V dc Input voltage range (VIN) - - - - - - - - - - - - - - - - 0 to VCC Output voltage range (VOUT) - - - - - - - - - - - - - - - 0.to VCC High level input voltage (VIH)- - - - - - - - - - - - - - 2 V minimum Low level input voltage (VIL) - - - - - - - - - - - - - - 0.8 V maximum High level output current (IOH): TDO, DTD01-4, MCO - - - - - - - - - - - - - −8.5 mW DTMS1-4, DCO (3-state), DTCK - - - - - - - −13.6 mA Low level output current (IOL): TDO, DTD01-4, MCO - - - - - - - - - - - - - 8.5 mA DCO, (open drain or 3-state) - - - - - - - 13.6 mA DTMS1-4 - - - - - - - - - - - - - - - - - - 20.4 mA DTCK - - - - - - - - - - - - - - - - - - - 40.8 mA Ambient operating temperature range (TA) - - - - - - - - −55°C to +125°C

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) - - - - - - - - - - - - 3/ percent

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

January 23, 2019
MICROCIRCUIT, DIGITAL, CMOS, SCAN PATH LINKERS WITH 4-BIT ID BUS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
September 10, 2013
MICROCIRCUIT, DIGITAL, CMOS, SCAN PATH LINKERS WITH 4-BIT ID BUS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
June 22, 2005
MICROCIRCUIT, DIGITAL, CMOS, SCAN PATH LINKERS WITH 4-BIT ID BUS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
March 24, 1994
MICROCIRCUIT, DIGITAL, CMOS, SCAN PATH LINKERS WITH 4-BIT ID BUS, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-93239
January 20, 1994
MICROCIRCUIT, DIGITAL, CMOS, SCAN PATH LINKERS WITH 4-BIT ID BUS, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q, and M) and...

References

Advertisement