DLA - SMD-5962-93239 REV B
MICROCIRCUIT, DIGITAL, CMOS, SCAN PATH LINKERS WITH 4-BIT ID BUS, MONOLITHIC SILICON
inactive
| Organization: | DLA |
| Publication Date: | 22 June 2005 |
| Status: | inactive |
| Page Count: | 19 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
January 23, 2019
MICROCIRCUIT, DIGITAL, CMOS, SCAN PATH LINKERS WITH 4-BIT ID BUS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
September 10, 2013
MICROCIRCUIT, DIGITAL, CMOS, SCAN PATH LINKERS WITH 4-BIT ID BUS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-93239 REV B
June 22, 2005
MICROCIRCUIT, DIGITAL, CMOS, SCAN PATH LINKERS WITH 4-BIT ID BUS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
March 24, 1994
MICROCIRCUIT, DIGITAL, CMOS, SCAN PATH LINKERS WITH 4-BIT ID BUS, MONOLITHIC SILICON
A description is not available for this item.
January 20, 1994
MICROCIRCUIT, DIGITAL, CMOS, SCAN PATH LINKERS WITH 4-BIT ID BUS, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q, and M) and...