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DOD - SMD 5962-96643

MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, HEX BUFFER, MONOLITHIC SILICON

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Organization: DOD
Publication Date: 24 July 2014
Status: inactive
Page Count: 21
scope:

This drawing documents two product assurance class levels consisting of high reliability device classes Q and space application device class V. A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Document History

March 24, 2021
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, HEX BUFFER, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability device classes Q and space application device class V. A choice of case outlines and lead finishes are...
SMD 5962-96643
July 24, 2014
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, HEX BUFFER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability device classes Q and space application device class V. A choice of case outlines and lead finishes are...
February 2, 2004
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, HEX BUFFER, MONOLITHIC SILICON
A description is not available for this item.
December 12, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, HEX BUFFER, MONOLITHIC SILICON
This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535...
December 27, 1995
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, HEX BUFFER, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...

References

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