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DLA - SMD-5962-96643 REV A

MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, HEX BUFFER, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 12 December 1997
Status: inactive
Page Count: 24
scope:

This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535 and the manufacturers approved QM plan for use in monolithic microcircuits, multichip modules (MCMs), hybrids, electronic modules, or devices using chip and wire designs in accordance with MIL-PRF-38534 are specified herein. Two product assurance classes consisting of military high reliability (device class Q) and space application (device Class V) are reflected in the Part or Identification Number (PIN). When available a choice of Radiation Hardiness Assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes Q and V RHA identified die shall meet the MIL-PRF-38535 specified RHA levels. A dash (-) indicates a non-RHA die.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function 01 4503B Radiation Hardened, CMOS, hex buffer. 02 4503BN Radiation Hardened, CMOS, hex buffer, neutron irradiated, die.

Device class Device requirements documentation Q or V Certification and qualification to the die requirements of MIL-PRF-38535.

The die details designation shall be a unique letter which designates the die's physical dimensions, bonding pad location(s) and related electrical function(s), interface materials, and other assembly related information, for each product and variant supplied to this appendix.

Die Type Figure number 01, 02 A-1

Die Type Figure number 01, 02 A-1

Die Type Figure number 01, 02 A-1

01, 02 A-1

See paragraph 1.3 within the body of this drawing for details.

See paragraph 1.4 within the body of this drawing for details.

intended Use:

Microcircuit die conforming to this drawing are intended for use in microcircuits built in accordance with MIL-PRF-38535 or MIL-PRF-38534 for government microcircuit applications (original... View More

Document History

March 24, 2021
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, HEX BUFFER, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability device classes Q and space application device class V. A choice of case outlines and lead finishes are...
July 24, 2014
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, HEX BUFFER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability device classes Q and space application device class V. A choice of case outlines and lead finishes are...
February 2, 2004
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, HEX BUFFER, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-96643 REV A
December 12, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, HEX BUFFER, MONOLITHIC SILICON
This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535...
December 27, 1995
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, HEX BUFFER, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...

References

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